Aberration-corrected STEM and EELS of semiconducting nanostructures

K. Cui, S. Hosseini Vajargah, S. Y. Woo, M. Couillard, S. Lazar, R. N. Kidman, D. A. Thompson, G. A. Botton

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations

Fingerprint

Dive into the research topics of 'Aberration-corrected STEM and EELS of semiconducting nanostructures'. Together they form a unique fingerprint.

Engineering

Material Science