Aberration corrected STEM analysis of nanowires

A. R. Lupini, K. Van Benthem, M. Varela, S. J. Pennycook

Research output: Contribution to conferencePaperpeer-review

Original languageEnglish
Pages11065-11069
Number of pages5
StatePublished - 2005
Event05AIChE: 2005 AIChE Annual Meeting and Fall Showcase - Cincinnati, OH, United States
Duration: Oct 30 2005Nov 4 2005

Conference

Conference05AIChE: 2005 AIChE Annual Meeting and Fall Showcase
Country/TerritoryUnited States
CityCincinnati, OH
Period10/30/0511/4/05

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