Aberration-corrected four-detector STEM-EDS analysis of embedded nanoclusters

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	568-569
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614004565
State	Published - Aug 1 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014

Access to Document

@article{35440381e76f498189037f1401c1ae6b,

title = "Aberration-corrected four-detector STEM-EDS analysis of embedded nanoclusters",

author = "Parish, {Chad M.} and Miller, {Michael K.}",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S1431927614004565",

language = "English",

volume = "20",

pages = "568--569",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "3",

note = "Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

}

TY - JOUR

T1 - Aberration-corrected four-detector STEM-EDS analysis of embedded nanoclusters

AU - Parish, Chad M.

AU - Miller, Michael K.

PY - 2014/8/1

Y1 - 2014/8/1

UR - http://www.scopus.com/inward/record.url?scp=84927934493&partnerID=8YFLogxK

U2 - 10.1017/S1431927614004565

DO - 10.1017/S1431927614004565

M3 - Conference article

AN - SCOPUS:84927934493

SN - 1431-9276

VL - 20

SP - 568

EP - 569

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -