Abstract
We describe the design and current performance of the backscattering silicon spectrometer (BASIS), a time-of-flight backscattering spectrometer built at the spallation neutron source (SNS) of the Oak Ridge National Laboratory (ORNL). BASIS is the first silicon-based backscattering spectrometer installed at a spallation neutron source. In addition to high intensity, it offers a high-energy resolution of about 3.5 μeV and a large and variable energy transfer range. These ensure an excellent overlap with the dynamic ranges accessible at other inelastic spectrometers at the SNS.
| Original language | English |
|---|---|
| Article number | 085109 |
| Journal | Review of Scientific Instruments |
| Volume | 82 |
| Issue number | 8 |
| DOIs | |
| State | Published - Aug 2011 |
Funding
The design, construction, and commissioning of the BASIS have been the result of efforts of many scientists, engineers, technicians, programmers, and other personnel at the ORNL's Spallation Neutron Source. The authors are deeply thankful to all those who contributed to the successful construction and operation of the spectrometer. We are grateful to M. Hagen and M. Zamponi for fruitful discussions. The operation and user program at the SNS is supported by the Scientific User Facilities Division, Office of Basic Energy Sciences, (U.S.) Department of Energy (DOE).