A swept two-frequency microwave reflectometer for edge density profile measurements on TFTR

G. R. Hanson, J. B. Wilgen, T. S. Bigelow, I. Collazo, C. E. Thomas

Research output: Contribution to journalArticlepeer-review

20 Scopus citations

Abstract

The edge density profile can play a significant role in determining the plasma confinement and the coupling of the ion cyclotron resonance frequency (ICRF) heating power to the plasma. To experimentally measure the edge density profile in the Tokamak Fusion Test Facility (TFTR), a two-frequency microwave reflectometer is being built. This reflectometer will operate in a swept two-frequency configuration between 91 and 118 GHz using the extraordinary mode. The frequency separation between the two microwave signals will be held constant while the signals are swept across the frequency band. By measuring the differential phase delay between these two signals, the density profile can be reconstructed. Two-frequency profile reflectometry is discussed and results of modeling of this type of reflectometer measurement for TFTR are shown. Finally, the design of the TFTR edge profile reflectometer microwave system is described.

Original languageEnglish
Pages (from-to)4658-4660
Number of pages3
JournalReview of Scientific Instruments
Volume63
Issue number10
DOIs
StatePublished - 1992

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