Original language | English |
---|---|
Pages (from-to) | 422-424 |
Number of pages | 3 |
Journal | Transactions of the American Nuclear Society |
Volume | 92 |
State | Published - 2005 |
Externally published | Yes |
Event | 2005 Annual Meeting - American Nuclear Society - San Diego, CA, United States Duration: Jun 5 2005 → Jun 9 2005 |
A survey of reliability modeling methodologies for digital instrumentation and control systems
Jason Kirschenbaum, Michael Stovsky, Paolo Bucci, Tune Aldemir, Steven A. Arndt
Research output: Contribution to journal › Conference article › peer-review
2
Scopus
citations