A strong loophole-free test of local realism

Lynden K. Shalm; Evan Meyer-Scott; Bradley G. Christensen; Peter Bierhorst; Michael A. Wayne; Martin J. Stevens; Thomas Gerrits; Scott Glancy; Deny R. Hamel; Michael S. Allman; Kevin J. Coakley; Shellee D. Dyer; Carson Hodge; Adriana E. Lita; Varun B. Verma; Camilla Lambrocco; Edward Tortorici; Alan L. Migdall; Yanbao Zhang; Daniel R. Kumor; William H. Farr; Francesco Marsili; Matthew D. Shaw; Jeffrey A. Stern; Carlos Abellan; Waldimar Amaya; Valerio Pruneri; Thomas Jennewein; Morgan W. Mitchell; Paul G. Kwiat; Joshua C. Bienfang; Richard P. Mirin; Emanuel Knill; Sae Woo Nam

doi:10.1364/cleo_qels.2016.fw4c.1

A strong loophole-free test of local realism

Lynden K. Shalm, Evan Meyer-Scott, Bradley G. Christensen, Peter Bierhorst, Michael A. Wayne, Martin J. Stevens, Thomas Gerrits, Scott Glancy, Deny R. Hamel, Michael S. Allman, Kevin J. Coakley, Shellee D. Dyer, Carson Hodge, Adriana E. Lita, Varun B. Verma, Camilla Lambrocco, Edward Tortorici, Alan L. Migdall, Yanbao Zhang, Daniel R. KumorWilliam H. Farr, Francesco Marsili, Matthew D. Shaw, Jeffrey A. Stern, Carlos Abellan, Waldimar Amaya, Valerio Pruneri, Thomas Jennewein, Morgan W. Mitchell, Paul G. Kwiat, Joshua C. Bienfang, Richard P. Mirin, Emanuel Knill, Sae Woo Nam

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We performed an loophole-free test of Bells inequalities. The probability that local realism is compatible with our results is less than 5.9×10^-9.

Original language	English
Title of host publication	2016 Conference on Lasers and Electro-Optics, CLEO 2016
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781943580118
DOIs	https://doi.org/10.1364/cleo_qels.2016.fw4c.1
State	Published - Dec 16 2016
Externally published	Yes
Event	2016 Conference on Lasers and Electro-Optics, CLEO 2016 - San Jose, United States Duration: Jun 5 2016 → Jun 10 2016

Publication series

Name	2016 Conference on Lasers and Electro-Optics, CLEO 2016

Conference

Conference	2016 Conference on Lasers and Electro-Optics, CLEO 2016
Country/Territory	United States
City	San Jose
Period	06/5/16 → 06/10/16

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10.1364/cleo_qels.2016.fw4c.1

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Shalm, L. K., Meyer-Scott, E., Christensen, B. G., Bierhorst, P., Wayne, M. A., Stevens, M. J., Gerrits, T., Glancy, S., Hamel, D. R., Allman, M. S., Coakley, K. J., Dyer, S. D., Hodge, C., Lita, A. E., Verma, V. B., Lambrocco, C., Tortorici, E., Migdall, A. L., Zhang, Y., ... Nam, S. W. (2016). A strong loophole-free test of local realism. In 2016 Conference on Lasers and Electro-Optics, CLEO 2016 Article 7787944 (2016 Conference on Lasers and Electro-Optics, CLEO 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1364/cleo_qels.2016.fw4c.1

@inproceedings{173ad65ac9d74b43a106646b9cf8d9e0,

title = "A strong loophole-free test of local realism",

abstract = "We performed an loophole-free test of Bells inequalities. The probability that local realism is compatible with our results is less than 5.9×10-9.",

author = "Shalm, {Lynden K.} and Evan Meyer-Scott and Christensen, {Bradley G.} and Peter Bierhorst and Wayne, {Michael A.} and Stevens, {Martin J.} and Thomas Gerrits and Scott Glancy and Hamel, {Deny R.} and Allman, {Michael S.} and Coakley, {Kevin J.} and Dyer, {Shellee D.} and Carson Hodge and Lita, {Adriana E.} and Verma, {Varun B.} and Camilla Lambrocco and Edward Tortorici and Migdall, {Alan L.} and Yanbao Zhang and Kumor, {Daniel R.} and Farr, {William H.} and Francesco Marsili and Shaw, {Matthew D.} and Stern, {Jeffrey A.} and Carlos Abellan and Waldimar Amaya and Valerio Pruneri and Thomas Jennewein and Mitchell, {Morgan W.} and Kwiat, {Paul G.} and Bienfang, {Joshua C.} and Mirin, {Richard P.} and Emanuel Knill and Nam, {Sae Woo}",

note = "Publisher Copyright: {\textcopyright} 2016 OSA.; 2016 Conference on Lasers and Electro-Optics, CLEO 2016 ; Conference date: 05-06-2016 Through 10-06-2016",

year = "2016",

month = dec,

day = "16",

doi = "10.1364/cleo_qels.2016.fw4c.1",

language = "English",

series = "2016 Conference on Lasers and Electro-Optics, CLEO 2016",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2016 Conference on Lasers and Electro-Optics, CLEO 2016",

}

Shalm, LK, Meyer-Scott, E, Christensen, BG, Bierhorst, P, Wayne, MA, Stevens, MJ, Gerrits, T, Glancy, S, Hamel, DR, Allman, MS, Coakley, KJ, Dyer, SD, Hodge, C, Lita, AE, Verma, VB, Lambrocco, C, Tortorici, E, Migdall, AL, Zhang, Y, Kumor, DR, Farr, WH, Marsili, F, Shaw, MD, Stern, JA, Abellan, C, Amaya, W, Pruneri, V, Jennewein, T, Mitchell, MW, Kwiat, PG, Bienfang, JC, Mirin, RP, Knill, E & Nam, SW 2016, A strong loophole-free test of local realism. in 2016 Conference on Lasers and Electro-Optics, CLEO 2016., 7787944, 2016 Conference on Lasers and Electro-Optics, CLEO 2016, Institute of Electrical and Electronics Engineers Inc., 2016 Conference on Lasers and Electro-Optics, CLEO 2016, San Jose, United States, 06/5/16. https://doi.org/10.1364/cleo_qels.2016.fw4c.1

A strong loophole-free test of local realism. / Shalm, Lynden K.; Meyer-Scott, Evan; Christensen, Bradley G. et al.
2016 Conference on Lasers and Electro-Optics, CLEO 2016. Institute of Electrical and Electronics Engineers Inc., 2016. 7787944 (2016 Conference on Lasers and Electro-Optics, CLEO 2016).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - A strong loophole-free test of local realism

AU - Shalm, Lynden K.

AU - Meyer-Scott, Evan

AU - Christensen, Bradley G.

AU - Bierhorst, Peter

AU - Wayne, Michael A.

AU - Stevens, Martin J.

AU - Gerrits, Thomas

AU - Glancy, Scott

AU - Hamel, Deny R.

AU - Allman, Michael S.

AU - Coakley, Kevin J.

AU - Dyer, Shellee D.

AU - Hodge, Carson

AU - Lita, Adriana E.

AU - Verma, Varun B.

AU - Lambrocco, Camilla

AU - Tortorici, Edward

AU - Migdall, Alan L.

AU - Zhang, Yanbao

AU - Kumor, Daniel R.

AU - Farr, William H.

AU - Marsili, Francesco

AU - Shaw, Matthew D.

AU - Stern, Jeffrey A.

AU - Abellan, Carlos

AU - Amaya, Waldimar

AU - Pruneri, Valerio

AU - Jennewein, Thomas

AU - Mitchell, Morgan W.

AU - Kwiat, Paul G.

AU - Bienfang, Joshua C.

AU - Mirin, Richard P.

AU - Knill, Emanuel

AU - Nam, Sae Woo

PY - 2016/12/16

Y1 - 2016/12/16

N2 - We performed an loophole-free test of Bells inequalities. The probability that local realism is compatible with our results is less than 5.9×10-9.

AB - We performed an loophole-free test of Bells inequalities. The probability that local realism is compatible with our results is less than 5.9×10-9.

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U2 - 10.1364/cleo_qels.2016.fw4c.1

DO - 10.1364/cleo_qels.2016.fw4c.1

M3 - Conference contribution

AN - SCOPUS:85010691016

T3 - 2016 Conference on Lasers and Electro-Optics, CLEO 2016

BT - 2016 Conference on Lasers and Electro-Optics, CLEO 2016

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2016 Conference on Lasers and Electro-Optics, CLEO 2016

Y2 - 5 June 2016 through 10 June 2016

ER -

A strong loophole-free test of local realism

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