A standard for sub-ångstrom metrology of resolution in aberration-corrected transmission electron microscopes

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Original language	English
Pages (from-to)	1002-1003
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	10
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927604880681
State	Published - 2004

Access to Document

@article{cf5301601bf44069a19df91e424205ac,

title = "A standard for sub-{\aa}ngstrom metrology of resolution in aberration-corrected transmission electron microscopes",

author = "O'Keefe, \{Michael A.\} and Allard, \{Lawrence F.\}",

year = "2004",

doi = "10.1017/S1431927604880681",

language = "English",

volume = "10",

pages = "1002--1003",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - A standard for sub-ångstrom metrology of resolution in aberration-corrected transmission electron microscopes

AU - O'Keefe, Michael A.

AU - Allard, Lawrence F.

PY - 2004

Y1 - 2004

UR - https://www.scopus.com/pages/publications/4544314556

U2 - 10.1017/S1431927604880681

DO - 10.1017/S1431927604880681

M3 - Article

AN - SCOPUS:4544314556

SN - 1431-9276

VL - 10

SP - 1002

EP - 1003

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -