A standard for sub-ångstrom metrology of resolution in aberration-corrected transmission electron microscopes

Michael A. O'Keefe, Lawrence F. Allard

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Original language	English
Pages (from-to)	1002-1003
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	10
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927604880681
State	Published - 2004

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title = "A standard for sub-{\aa}ngstrom metrology of resolution in aberration-corrected transmission electron microscopes",

author = "O'Keefe, {Michael A.} and Allard, {Lawrence F.}",

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AU - O'Keefe, Michael A.

AU - Allard, Lawrence F.

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