A SiGe BiCMOS instrumentation channel for extreme environment applications

C. Ulaganathan, N. Nambiar, B. Prothro, R. Greenwell, S. Chen, B. J. Blalock, C. L. Britton, M. N. Ericson, H. Hoang, R. Broughton, K. Cornett, G. Fu, H. A. Mantooth, J. D. Cressler, R. W. Berger

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

12 Scopus citations

Abstract

A instrumentation channel has been designed, implemented and tested in a 0.5-μm SiGe BiCMOS process. The circuit features a reconfigurable Wheatstone bridge network that interfaces a range of external sensors to signal processing circuits. Also, analog sampling has been implemented in the channel using a flying capacitor configuration. Measurement results show the instrumentation channel supports input signals up to 200Hz.

Original languageEnglish
Title of host publication2008 IEEE International 51st Midwest Symposium on Circuits and Systems, MWSCAS
Pages217-220
Number of pages4
DOIs
StatePublished - 2008
Externally publishedYes
Event2008 IEEE International 51st Midwest Symposium on Circuits and Systems, MWSCAS - Knoxville, TN, United States
Duration: Aug 10 2008Aug 13 2008

Publication series

NameMidwest Symposium on Circuits and Systems
ISSN (Print)1548-3746

Conference

Conference2008 IEEE International 51st Midwest Symposium on Circuits and Systems, MWSCAS
Country/TerritoryUnited States
CityKnoxville, TN
Period08/10/0808/13/08

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