A SiGe BiCMOS instrumentation channel for extreme environment applications

Chandradevi Ulaganathan; Neena Nambiar; Kimberly Cornett; Robert L. Greenwell; Jeremy A. Yager; Benjamin S. Prothro; Kevin Tham; Suheng Chen; Richard S. Broughton; Guoyuan Fu; Benjamin J. Blalock; Charles L. Britton; M. Nance Ericson; H. Alan Mantooth; Mohammad M. Mojarradi; Richard W. Berger; John D. Cressler

doi:10.1155/2010/156829

A SiGe BiCMOS instrumentation channel for extreme environment applications

Chandradevi Ulaganathan, Neena Nambiar, Kimberly Cornett, Robert L. Greenwell, Jeremy A. Yager, Benjamin S. Prothro, Kevin Tham, Suheng Chen, Richard S. Broughton, Guoyuan Fu, Benjamin J. Blalock, Charles L. Britton, M. Nance Ericson, H. Alan Mantooth, Mohammad M. Mojarradi, Richard W. Berger, John D. Cressler

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

An instrumentation channel is designed, implemented, and tested in a 0.5- m SiGe BiCMOS process. The circuit features a reconfigurable Wheatstone bridge network that interfaces an assortment of external sensors to signal processing circuits. Also, analog sampling is implemented in the channel using a flying capacitor configuration. The analog samples are digitized by a low-power multichannel A/D converter. Measurement results show that the instrumentation channel supports input signals up to 200Hz and operates across a wide temperature range of - 180 C to 125 C. This work demonstrates the use of a commercially available first generation SiGe BiCMOS process in designing circuits suitable for extreme environment applications.

Original language	English
Article number	156829
Journal	VLSI Design
Volume	2010
DOIs	https://doi.org/10.1155/2010/156829
State	Published - 2010
Externally published	Yes

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Ulaganathan, C., Nambiar, N., Cornett, K., Greenwell, R. L., Yager, J. A., Prothro, B. S., Tham, K., Chen, S., Broughton, R. S., Fu, G., Blalock, B. J., Britton, C. L., Ericson, M. N., Mantooth, H. A., Mojarradi, M. M., Berger, R. W., & Cressler, J. D. (2010). A SiGe BiCMOS instrumentation channel for extreme environment applications. VLSI Design, 2010, Article 156829. https://doi.org/10.1155/2010/156829

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abstract = "An instrumentation channel is designed, implemented, and tested in a 0.5- m SiGe BiCMOS process. The circuit features a reconfigurable Wheatstone bridge network that interfaces an assortment of external sensors to signal processing circuits. Also, analog sampling is implemented in the channel using a flying capacitor configuration. The analog samples are digitized by a low-power multichannel A/D converter. Measurement results show that the instrumentation channel supports input signals up to 200Hz and operates across a wide temperature range of - 180 C to 125 C. This work demonstrates the use of a commercially available first generation SiGe BiCMOS process in designing circuits suitable for extreme environment applications.",

author = "Chandradevi Ulaganathan and Neena Nambiar and Kimberly Cornett and Greenwell, {Robert L.} and Yager, {Jeremy A.} and Prothro, {Benjamin S.} and Kevin Tham and Suheng Chen and Broughton, {Richard S.} and Guoyuan Fu and Blalock, {Benjamin J.} and Britton, {Charles L.} and Ericson, {M. Nance} and Mantooth, {H. Alan} and Mojarradi, {Mohammad M.} and Berger, {Richard W.} and Cressler, {John D.}",

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AU - Ulaganathan, Chandradevi

AU - Nambiar, Neena

AU - Cornett, Kimberly

AU - Greenwell, Robert L.

AU - Yager, Jeremy A.

AU - Prothro, Benjamin S.

AU - Tham, Kevin

AU - Chen, Suheng

AU - Broughton, Richard S.

AU - Fu, Guoyuan

AU - Blalock, Benjamin J.

AU - Britton, Charles L.

AU - Ericson, M. Nance

AU - Mantooth, H. Alan

AU - Mojarradi, Mohammad M.

AU - Berger, Richard W.

AU - Cressler, John D.

PY - 2010

Y1 - 2010

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AB - An instrumentation channel is designed, implemented, and tested in a 0.5- m SiGe BiCMOS process. The circuit features a reconfigurable Wheatstone bridge network that interfaces an assortment of external sensors to signal processing circuits. Also, analog sampling is implemented in the channel using a flying capacitor configuration. The analog samples are digitized by a low-power multichannel A/D converter. Measurement results show that the instrumentation channel supports input signals up to 200Hz and operates across a wide temperature range of - 180 C to 125 C. This work demonstrates the use of a commercially available first generation SiGe BiCMOS process in designing circuits suitable for extreme environment applications.

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A SiGe BiCMOS instrumentation channel for extreme environment applications

Abstract

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