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A pixelated x-ray detector for diffraction imaging at next-generation high-rate FEL sources

  • L. Lodola
  • , L. Ratti
  • , D. Comotti
  • , L. Fabris
  • , M. Grassi
  • , P. Malcovati
  • , M. Manghisoni
  • , V. Re
  • , G. Traversi
  • , C. Vacchi
  • , G. Batignani
  • , S. Bettarini
  • , F. Forti
  • , G. Casarosa
  • , F. Morsani
  • , A. Paladino
  • , E. Paoloni
  • , G. Rizzo
  • , M. A. Benkechkache
  • , G. F. Dalla Betta
  • R. Mendicino, L. Pancheri, G. Verzellesi, H. Xu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

The PixFEL collaboration has developed the building blocks for an X-ray imager to be used in applications at FELs. In particular, slim edge pixel detectors with high detection efficiency over a broad energy range, from 1 to 12 keV, have been developed. Moreover, a multichannel readout chip, called PFM2 (PixFEL front-end Matrix 2) and consisting of 32 × 32 cells, has been designed and fabricated in a 65 nm CMOS technology. The pixel pitch is 110 μm, the overall area is around 16 mm2. In the chip, different solutions have been implemented for the readout channel, which includes a charge sensitive amplifier (CSA) with dynamic signal compression, a time-variant shaper and an A-To-D converter with a 10 bit resolution. The CSA can be configured in four different gain modes, so as to comply with photon energies in the 1 to 10 keV range. The paper will describe in detail the channel architecture and present the results from the characterization of PFM2. It will discuss the design of a new version of the chip, called PFM3, suitable for post-processing with peripheral, under-pad through silicon vias (TSVs), which are needed to develop four-side buttable chips and cover large surfaces with minimum inactive area.

Original languageEnglish
Title of host publicationHard X-Ray, Gamma-Ray, and Neutron Detector Physics XIX
EditorsRalph B. James, Michael Fiederle, Arnold Burger, Stephen A. Payne, Larry Franks
PublisherSPIE
ISBN (Electronic)9781510612419
DOIs
StatePublished - 2017
EventHard X-Ray, Gamma-Ray, and Neutron Detector Physics XIX 2017 - San Diego, United States
Duration: Aug 7 2017Aug 9 2017

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10392
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceHard X-Ray, Gamma-Ray, and Neutron Detector Physics XIX 2017
Country/TerritoryUnited States
CitySan Diego
Period08/7/1708/9/17

Keywords

  • Pixel detectors
  • Readout electronics
  • TSV
  • Vertical integration
  • X-ray FEL

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