A pixelated x-ray detector for diffraction imaging at next-generation high-rate FEL sources

L. Lodola, L. Ratti, D. Comotti, L. Fabris, M. Grassi, P. Malcovati, M. Manghisoni, V. Re, G. Traversi, C. Vacchi, G. Batignani, S. Bettarini, F. Forti, G. Casarosa, F. Morsani, A. Paladino, E. Paoloni, G. Rizzo, M. A. Benkechkache, G. F. Dalla BettaR. Mendicino, L. Pancheri, G. Verzellesi, H. Xu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

The PixFEL collaboration has developed the building blocks for an X-ray imager to be used in applications at FELs. In particular, slim edge pixel detectors with high detection efficiency over a broad energy range, from 1 to 12 keV, have been developed. Moreover, a multichannel readout chip, called PFM2 (PixFEL front-end Matrix 2) and consisting of 32 × 32 cells, has been designed and fabricated in a 65 nm CMOS technology. The pixel pitch is 110 μm, the overall area is around 16 mm2. In the chip, different solutions have been implemented for the readout channel, which includes a charge sensitive amplifier (CSA) with dynamic signal compression, a time-variant shaper and an A-To-D converter with a 10 bit resolution. The CSA can be configured in four different gain modes, so as to comply with photon energies in the 1 to 10 keV range. The paper will describe in detail the channel architecture and present the results from the characterization of PFM2. It will discuss the design of a new version of the chip, called PFM3, suitable for post-processing with peripheral, under-pad through silicon vias (TSVs), which are needed to develop four-side buttable chips and cover large surfaces with minimum inactive area.

Original languageEnglish
Title of host publicationHard X-Ray, Gamma-Ray, and Neutron Detector Physics XIX
EditorsRalph B. James, Michael Fiederle, Arnold Burger, Stephen A. Payne, Larry Franks
PublisherSPIE
ISBN (Electronic)9781510612419
DOIs
StatePublished - 2017
EventHard X-Ray, Gamma-Ray, and Neutron Detector Physics XIX 2017 - San Diego, United States
Duration: Aug 7 2017Aug 9 2017

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10392
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceHard X-Ray, Gamma-Ray, and Neutron Detector Physics XIX 2017
Country/TerritoryUnited States
CitySan Diego
Period08/7/1708/9/17

Keywords

  • Pixel detectors
  • Readout electronics
  • TSV
  • Vertical integration
  • X-ray FEL

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