Original language | English |
---|---|
Pages (from-to) | 792-793 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 14 |
Issue number | SUPPL. 2 |
DOIs | |
State | Published - Aug 2008 |
A new paradigm for ultra-high-resolution imaging at elevated temperatures
L. F. Allard, W. C. Bigelow, D. Nackashi, J. Damiano, S. E. Mick
Research output: Contribution to journal › Article › peer-review
7
Scopus
citations