A new method for microwave characterization of metallic single-walled carbon nanotubes

Song Chunrong, Liu Zuqin, Gyula Eres, David B. Geohegan, Pingshan Wang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

On-chip subtraction of capacitive parasitic effects is proposed for microwave characterization of individual metallic single-walled carbon nanotube (mSWNT) that yields low intensity signals. The method dramatically reduces capacitive parasitic effects to uncover the otherwise buried signals. Both computer simulations and experimental measurements of small capacitance demonstrated the efficacy of the approach.

Original languageEnglish
Title of host publication2008 8th IEEE Conference on Nanotechnology, IEEE-NANO
Pages228-229
Number of pages2
DOIs
StatePublished - 2008
Event2008 8th IEEE Conference on Nanotechnology, IEEE-NANO - Arlington, TX, United States
Duration: Aug 18 2008Aug 21 2008

Publication series

Name2008 8th IEEE Conference on Nanotechnology, IEEE-NANO

Conference

Conference2008 8th IEEE Conference on Nanotechnology, IEEE-NANO
Country/TerritoryUnited States
CityArlington, TX
Period08/18/0808/21/08

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