| Original language | English |
|---|---|
| Pages (from-to) | 478-479 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 8 |
| Issue number | SUPPL. 2 |
| DOIs | |
| State | Published - 2002 |
A new laboratory designed to provide an optimum environment for aberration-corrected electron microscopes
- L. F. Allard
- , D. A. Blom
- , T. A. Nolan
- , W. H. Sides
- , L. J. Degenhardt
- , J. A. Mayo
- , W. Vogen
- , E. St. Romain
Research output: Contribution to journal › Article › peer-review