A new laboratory designed to provide an optimum environment for aberration-corrected electron microscopes

L. F. Allard, D. A. Blom, T. A. Nolan, W. H. Sides, L. J. Degenhardt, J. A. Mayo, W. Vogen, E. St. Romain

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)478-479
Number of pages2
JournalMicroscopy and Microanalysis
Volume8
Issue numberSUPPL. 2
DOIs
StatePublished - 2002

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