Original language | English |
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Pages (from-to) | 478-479 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 8 |
Issue number | SUPPL. 2 |
DOIs | |
State | Published - 2002 |
A new laboratory designed to provide an optimum environment for aberration-corrected electron microscopes
L. F. Allard, D. A. Blom, T. A. Nolan, W. H. Sides, L. J. Degenhardt, J. A. Mayo, W. Vogen, E. St. Romain
Research output: Contribution to journal › Article › peer-review