A multi-detector, digitizer based neutron depth profiling device for characterizing thin film materials

P. L. Mulligan; L. R. Cao; D. Turkoglu

doi:10.1063/1.4732168

A multi-detector, digitizer based neutron depth profiling device for characterizing thin film materials

P. L. Mulligan, L. R. Cao, D. Turkoglu

Research output: Contribution to journal › Review article › peer-review

8 Scopus citations

Abstract

Neutron depth profiling (NDP) is a mature, nondestructive technique used to characterize the concentration of certain light isotopes in a material as a function of depth by measuring the residual energy of charged particles in neutron induced reactions. Historically, NDP has been performed using a single detector, resulting in low intrinsic detection efficiency, and limiting the technique largely to high flux research reactors. In this work, we describe a new NDP instrument design with higher detection efficiency by way of spectrum summing across multiple detectors. Such a design is capable of acquiring a statistically significant charged particle spectrum at facilities limited in neutron flux and operation time.

Original language	English
Article number	073303
Journal	Review of Scientific Instruments
Volume	83
Issue number	7
DOIs	https://doi.org/10.1063/1.4732168
State	Published - Jul 2012
Externally published	Yes

Funding

The authors would like to acknowledge the assistance of Greg Downing at NIST, Marco Locatelli at CAEN S.p.A, and Joseph Talnagi, Andrew Kauffman, and Kevin Herminghuysen at the OSU Research Reactor in the completion of this work. This work is partially supported by the U.S. Nuclear Regulatory Commission award for The Ohio State University Nuclear Engineering Faculty Development Program.

Funders	Funder number
U.S. Nuclear Regulatory Commission
Ohio State University

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10.1063/1.4732168

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abstract = "Neutron depth profiling (NDP) is a mature, nondestructive technique used to characterize the concentration of certain light isotopes in a material as a function of depth by measuring the residual energy of charged particles in neutron induced reactions. Historically, NDP has been performed using a single detector, resulting in low intrinsic detection efficiency, and limiting the technique largely to high flux research reactors. In this work, we describe a new NDP instrument design with higher detection efficiency by way of spectrum summing across multiple detectors. Such a design is capable of acquiring a statistically significant charged particle spectrum at facilities limited in neutron flux and operation time.",

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AB - Neutron depth profiling (NDP) is a mature, nondestructive technique used to characterize the concentration of certain light isotopes in a material as a function of depth by measuring the residual energy of charged particles in neutron induced reactions. Historically, NDP has been performed using a single detector, resulting in low intrinsic detection efficiency, and limiting the technique largely to high flux research reactors. In this work, we describe a new NDP instrument design with higher detection efficiency by way of spectrum summing across multiple detectors. Such a design is capable of acquiring a statistically significant charged particle spectrum at facilities limited in neutron flux and operation time.

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A multi-detector, digitizer based neutron depth profiling device for characterizing thin film materials

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