A method of combining STEM image with parallel beam diffraction and electron-optical conditions for diffractive imaging

Haifeng He; Chris Nelson

doi:10.1016/j.ultramic.2006.09.002

A method of combining STEM image with parallel beam diffraction and electron-optical conditions for diffractive imaging

Haifeng He
, Chris Nelson

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

We describe a method of combining STEM imaging functionalities with nanoarea parallel beam electron diffraction on a modern TEM. This facilitates the search for individual particles whose diffraction patterns are needed for diffractive imaging or structural studies of nanoparticles. This also lays out a base for 3D diffraction data collection.

Original language	English
Pages (from-to)	340-344
Number of pages	5
Journal	Ultramicroscopy
Volume	107
Issue number	4-5
DOIs	https://doi.org/10.1016/j.ultramic.2006.09.002
State	Published - Apr 2007
Externally published	Yes

Funding

Thanks goes to Dr. Gerd Benner, Dr. Christian Kisielowski and Prof. John Spence for helpful discussions. This work is supported by Department of Energy under Grant No. DEFG0302 ER45996.

Keywords

Diffractive imaging
Electron optics
STEM

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10.1016/j.ultramic.2006.09.002

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title = "A method of combining STEM image with parallel beam diffraction and electron-optical conditions for diffractive imaging",

abstract = "We describe a method of combining STEM imaging functionalities with nanoarea parallel beam electron diffraction on a modern TEM. This facilitates the search for individual particles whose diffraction patterns are needed for diffractive imaging or structural studies of nanoparticles. This also lays out a base for 3D diffraction data collection.",

keywords = "Diffractive imaging, Electron optics, STEM",

author = "Haifeng He and Chris Nelson",

year = "2007",

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AU - Nelson, Chris

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AB - We describe a method of combining STEM imaging functionalities with nanoarea parallel beam electron diffraction on a modern TEM. This facilitates the search for individual particles whose diffraction patterns are needed for diffractive imaging or structural studies of nanoparticles. This also lays out a base for 3D diffraction data collection.

KW - Diffractive imaging

KW - Electron optics

KW - STEM

UR - https://www.scopus.com/pages/publications/33846373584

U2 - 10.1016/j.ultramic.2006.09.002

DO - 10.1016/j.ultramic.2006.09.002

M3 - Article

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JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 4-5

ER -

A method of combining STEM image with parallel beam diffraction and electron-optical conditions for diffractive imaging

Abstract

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Keywords

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