A method of combining STEM image with parallel beam diffraction and electron-optical conditions for diffractive imaging

Haifeng He; Chris Nelson

doi:10.1016/j.ultramic.2006.09.002

A method of combining STEM image with parallel beam diffraction and electron-optical conditions for diffractive imaging

Haifeng He, Chris Nelson

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

We describe a method of combining STEM imaging functionalities with nanoarea parallel beam electron diffraction on a modern TEM. This facilitates the search for individual particles whose diffraction patterns are needed for diffractive imaging or structural studies of nanoparticles. This also lays out a base for 3D diffraction data collection.

Original language	English
Pages (from-to)	340-344
Number of pages	5
Journal	Ultramicroscopy
Volume	107
Issue number	4-5
DOIs	https://doi.org/10.1016/j.ultramic.2006.09.002
State	Published - Apr 2007
Externally published	Yes

Keywords

Diffractive imaging
Electron optics
STEM

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10.1016/j.ultramic.2006.09.002

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title = "A method of combining STEM image with parallel beam diffraction and electron-optical conditions for diffractive imaging",

abstract = "We describe a method of combining STEM imaging functionalities with nanoarea parallel beam electron diffraction on a modern TEM. This facilitates the search for individual particles whose diffraction patterns are needed for diffractive imaging or structural studies of nanoparticles. This also lays out a base for 3D diffraction data collection.",

keywords = "Diffractive imaging, Electron optics, STEM",

author = "Haifeng He and Chris Nelson",

year = "2007",

month = apr,

doi = "10.1016/j.ultramic.2006.09.002",

language = "English",

volume = "107",

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journal = "Ultramicroscopy",

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AU - He, Haifeng

AU - Nelson, Chris

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AB - We describe a method of combining STEM imaging functionalities with nanoarea parallel beam electron diffraction on a modern TEM. This facilitates the search for individual particles whose diffraction patterns are needed for diffractive imaging or structural studies of nanoparticles. This also lays out a base for 3D diffraction data collection.

KW - Diffractive imaging

KW - Electron optics

KW - STEM

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U2 - 10.1016/j.ultramic.2006.09.002

DO - 10.1016/j.ultramic.2006.09.002

M3 - Article

AN - SCOPUS:33846373584

SN - 0304-3991

VL - 107

SP - 340

EP - 344

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 4-5

ER -

A method of combining STEM image with parallel beam diffraction and electron-optical conditions for diffractive imaging

Abstract

Keywords

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