Abstract
Current prognostics for life expectancy of power semiconductors utilize off-line measurements of the on-state resistance. Presented is a half-bridge (HB) on-state voltage (VON) sensor capable of being utilized for in-situ measurements enabling continuous and real-time monitoring of the on-state resistance. The design provides a single VON measurement output that contains independent VON information of both high and low side devices in a HB leg. The measurement output is referenced from the middle point of the HB and combines the two complementary VON sensing outputs. This system reduces the number of components, required number of analog signal processing circuits, and ADC channels for in-situ health monitoring of a power electronics system. These reductions will facilitate integration of the VON sensor with the gate driver board and achieve low system profile. The experimental results demonstrate the proposed VON measurements while switching with inductive and resistive loads.
Original language | English |
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Title of host publication | 2022 IEEE Energy Conversion Congress and Exposition, ECCE 2022 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9781728193878 |
DOIs | |
State | Published - 2022 |
Event | 2022 IEEE Energy Conversion Congress and Exposition, ECCE 2022 - Detroit, United States Duration: Oct 9 2022 → Oct 13 2022 |
Publication series
Name | 2022 IEEE Energy Conversion Congress and Exposition, ECCE 2022 |
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Conference
Conference | 2022 IEEE Energy Conversion Congress and Exposition, ECCE 2022 |
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Country/Territory | United States |
City | Detroit |
Period | 10/9/22 → 10/13/22 |
Funding
ACKNOWLEDGMENT This project was supported by Oak Ridge National Laboratory (ORNL) funded through the Department of Energy (DOE) - Office of Electricity's (OE), Transformer Resilience and Advanced Components (TRAC) program led by the program manager Andre Pereira. The authors would also like to thank the Energy Production and Infrastructure Center (EPIC) and Electrical and Computer Engineering Department at the University of North Carolina at Charlotte. This project was supported by Oak Ridge National Laboratory (ORNL) funded through the Department of Energy (DOE) - Office of Electricity's (OE), Transformer Resilience and Advanced Components (TRAC) program led by the program manager Andre Pereira. The authors would also like to thank the Energy Production and Infrastructure Center (EPIC) and Electrical and Computer Engineering Department at the University of North Carolina at Charlotte.
Keywords
- gallium nitride
- half-bridge on-state voltage sensor
- health monitoring
- on-state resistance
- on-state voltage
- prognostics
- reliability
- silicon carbide