A GEANT-based model for single event upsets in SRAM FPGAs for use in on-detector electronics

Steve Skutnik; John Lajoie

doi:10.1109/TNS.2006.878282

A GEANT-based model for single event upsets in SRAM FPGAs for use in on-detector electronics

Steve Skutnik, John Lajoie

Iowa State University

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

A model is developed to calculate expected Single Event Upset rates in Xilinx's line of radiation-hardened field programmable gate array (FPGA) offerings for the radiation environment at the PHENIX experiment on the Relativistic Heavy Ion Collider at Brookhaven National Laboratory. The results of this model are compared to an experiment carried out at PHENIX, where actual upset data was obtained. Specific attention is given to unique features of the model, including major sources of "secondary" radiation flux.

Original language	English
Article number	1684111
Pages (from-to)	2353-2360
Number of pages	8
Journal	IEEE Transactions on Nuclear Science
Volume	53
Issue number	4
DOIs	https://doi.org/10.1109/TNS.2006.878282
State	Published - Aug 2006
Externally published	Yes

Keywords

Field programmable gate arrays (FPGA)
Radiation effects
Single event effects
Single event upset modeling

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10.1109/TNS.2006.878282

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A GEANT-based model for single event upsets in SRAM FPGAs for use in on-detector electronics

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Keywords

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