A GEANT-based model for Single Event Upsets in SRAM FPGAs for use in on-detector electronics

Steven E. Skutnik; John G. Lajoie

doi:10.1109/NSSMIC.2005.1596447

A GEANT-based model for Single Event Upsets in SRAM FPGAs for use in on-detector electronics

Steven E. Skutnik, John G. Lajoie

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

A model is proposed to calculate expected Single Event Upset rates In Xilinx's line of radiation-hardened field programmable gate array offerings for the radiation environment at the PHENIX experiment on the Relativistic Heavy Ion Collider at Brookhaven National Laboratory. The results of this model are compared to an experiment carried out at PHENIX, where actual upset data was obtained. Specific attention is given to unique features of the model, including major sources of "secondary" radiation flux.

Original language	English
Title of host publication	2005 IEEE Nuclear Science Symposium Conference Record -Nuclear Science Symposium and Medical Imaging Conference
Pages	1117-1121
Number of pages	5
DOIs	https://doi.org/10.1109/NSSMIC.2005.1596447
State	Published - 2005
Externally published	Yes
Event	Nuclear Science Symposium Conference Record, 2005 IEEE - , Puerto Rico Duration: Oct 23 2005 → Oct 29 2005

Publication series

Name	IEEE Nuclear Science Symposium Conference Record
Volume	2
ISSN (Print)	1095-7863

Conference

Conference	Nuclear Science Symposium Conference Record, 2005 IEEE
Country/Territory	Puerto Rico
Period	10/23/05 → 10/29/05

Access to Document

10.1109/NSSMIC.2005.1596447

Cite this

Skutnik, S. E., & Lajoie, J. G. (2005). A GEANT-based model for Single Event Upsets in SRAM FPGAs for use in on-detector electronics. In 2005 IEEE Nuclear Science Symposium Conference Record -Nuclear Science Symposium and Medical Imaging Conference (pp. 1117-1121). Article 1596447 (IEEE Nuclear Science Symposium Conference Record; Vol. 2). https://doi.org/10.1109/NSSMIC.2005.1596447

@inproceedings{4a08bc7d9385450da86bab3fb725d25c,

title = "A GEANT-based model for Single Event Upsets in SRAM FPGAs for use in on-detector electronics",

abstract = "A model is proposed to calculate expected Single Event Upset rates In Xilinx's line of radiation-hardened field programmable gate array offerings for the radiation environment at the PHENIX experiment on the Relativistic Heavy Ion Collider at Brookhaven National Laboratory. The results of this model are compared to an experiment carried out at PHENIX, where actual upset data was obtained. Specific attention is given to unique features of the model, including major sources of {"}secondary{"} radiation flux.",

author = "Skutnik, {Steven E.} and Lajoie, {John G.}",

year = "2005",

doi = "10.1109/NSSMIC.2005.1596447",

language = "English",

isbn = "0780392213",

series = "IEEE Nuclear Science Symposium Conference Record",

pages = "1117--1121",

booktitle = "2005 IEEE Nuclear Science Symposium Conference Record -Nuclear Science Symposium and Medical Imaging Conference",

note = "Nuclear Science Symposium Conference Record, 2005 IEEE ; Conference date: 23-10-2005 Through 29-10-2005",

}

Skutnik, SE & Lajoie, JG 2005, A GEANT-based model for Single Event Upsets in SRAM FPGAs for use in on-detector electronics. in 2005 IEEE Nuclear Science Symposium Conference Record -Nuclear Science Symposium and Medical Imaging Conference., 1596447, IEEE Nuclear Science Symposium Conference Record, vol. 2, pp. 1117-1121, Nuclear Science Symposium Conference Record, 2005 IEEE, Puerto Rico, 10/23/05. https://doi.org/10.1109/NSSMIC.2005.1596447

A GEANT-based model for Single Event Upsets in SRAM FPGAs for use in on-detector electronics. / Skutnik, Steven E.; Lajoie, John G.
2005 IEEE Nuclear Science Symposium Conference Record -Nuclear Science Symposium and Medical Imaging Conference. 2005. p. 1117-1121 1596447 (IEEE Nuclear Science Symposium Conference Record; Vol. 2).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - A GEANT-based model for Single Event Upsets in SRAM FPGAs for use in on-detector electronics

AU - Skutnik, Steven E.

AU - Lajoie, John G.

PY - 2005

Y1 - 2005

N2 - A model is proposed to calculate expected Single Event Upset rates In Xilinx's line of radiation-hardened field programmable gate array offerings for the radiation environment at the PHENIX experiment on the Relativistic Heavy Ion Collider at Brookhaven National Laboratory. The results of this model are compared to an experiment carried out at PHENIX, where actual upset data was obtained. Specific attention is given to unique features of the model, including major sources of "secondary" radiation flux.

AB - A model is proposed to calculate expected Single Event Upset rates In Xilinx's line of radiation-hardened field programmable gate array offerings for the radiation environment at the PHENIX experiment on the Relativistic Heavy Ion Collider at Brookhaven National Laboratory. The results of this model are compared to an experiment carried out at PHENIX, where actual upset data was obtained. Specific attention is given to unique features of the model, including major sources of "secondary" radiation flux.

UR - http://www.scopus.com/inward/record.url?scp=33846587388&partnerID=8YFLogxK

U2 - 10.1109/NSSMIC.2005.1596447

DO - 10.1109/NSSMIC.2005.1596447

M3 - Conference contribution

AN - SCOPUS:33846587388

SN - 0780392213

SN - 9780780392212

T3 - IEEE Nuclear Science Symposium Conference Record

SP - 1117

EP - 1121

BT - 2005 IEEE Nuclear Science Symposium Conference Record -Nuclear Science Symposium and Medical Imaging Conference

T2 - Nuclear Science Symposium Conference Record, 2005 IEEE

Y2 - 23 October 2005 through 29 October 2005

ER -

A GEANT-based model for Single Event Upsets in SRAM FPGAs for use in on-detector electronics

Abstract

Publication series

Conference

Access to Document

Other files and links

Fingerprint

Cite this