A cryogenic Quadraprobe scanning tunneling microscope system with fabrication capability for nanotransport research

Tae Hwan Kim; Zhouhang Wang; John F. Wendelken; Hanno H. Weitering; Wenzhi Li; An Ping Li

doi:10.1063/1.2821610

A cryogenic Quadraprobe scanning tunneling microscope system with fabrication capability for nanotransport research

Tae Hwan Kim, Zhouhang Wang, John F. Wendelken, Hanno H. Weitering, Wenzhi Li, An Ping Li

Scanning Tunneling Microscopy Group

Research output: Contribution to journal › Article › peer-review

51 Scopus citations

Abstract

We describe the development and the capabilities of an advanced system for nanoscale electrical transport studies. This system consists of a low temperature four-probe scanning tunneling microscope (STM) and a high-resolution scanning electron microscope coupled to a molecular-beam epitaxy sample preparation chamber. The four STM probes can be manipulated independently with subnanometer precision, enabling atomic resolution STM imaging and four-point electrical transport study of surface electronic systems and nanostructured materials at temperatures down to 10 K. Additionally, an integrated energy analyzer allows for scanning Auger microscopy to probe chemical species of nanostructures. Some testing results are presented.

Original language	English
Article number	123701
Journal	Review of Scientific Instruments
Volume	78
Issue number	12
DOIs	https://doi.org/10.1063/1.2821610
State	Published - 2007

Funding

This work was supported by the Center for Nanophase Materials Sciences, which is sponsored at Oak Ridge National Laboratory by the Division of Scientific User Facilities, U.S. Department of Energy. H.H.W. and W.Z.L. would like to thank CNMS user project support at ORNL. In addition, W.Z.L. acknowledges supports from the National Science Foundation (Grant No. DMR-0548061).

Funders	Funder number
Center for Nanophase Materials Sciences
Division of Scientific User Facilities
National Science Foundation
U.S. Department of Energy
Oak Ridge National Laboratory

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10.1063/1.2821610

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abstract = "We describe the development and the capabilities of an advanced system for nanoscale electrical transport studies. This system consists of a low temperature four-probe scanning tunneling microscope (STM) and a high-resolution scanning electron microscope coupled to a molecular-beam epitaxy sample preparation chamber. The four STM probes can be manipulated independently with subnanometer precision, enabling atomic resolution STM imaging and four-point electrical transport study of surface electronic systems and nanostructured materials at temperatures down to 10 K. Additionally, an integrated energy analyzer allows for scanning Auger microscopy to probe chemical species of nanostructures. Some testing results are presented.",

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AU - Li, An Ping

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A cryogenic Quadraprobe scanning tunneling microscope system with fabrication capability for nanotransport research

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