A comparison of pwb warpage due to simulated infrared and wave soldering processes

Yarom Polsky, Walter Sutherlin, I. Charles Ume

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Two types of bare, four layer printed wiring board (PWB) test vehicles were designed and fabricated to replicate simplified versions of typical boards produced by PWB manufacturers. The boards were subjected to simulated infrared and wave soldering reflow processes in a small lab-scale oven integrated with a shadow Moiré out-of-plane displacement measurement system. The measured warpages were qualitatively and quantitatively analyzed at selected temperatures during the reflow profiles. The results presented compare and contrast the effects that simulated wave and infrared reflow soldering processes have on the warpage of two different PWB designs.

Original languageEnglish
Pages (from-to)155
Number of pages1
JournalIEEE Transactions on Electronics Packaging Manufacturing
Volume23
Issue number3
StatePublished - Jul 2000
Externally publishedYes

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