Abstract
We introduce and numerically validate a Bayesian method for plasmonic nanometrology. Applicable to any system described by a scattering cross section, our approach quantifies uncertainty automatically and enables model comparison through Bayes factors.
| Original language | English |
|---|---|
| Title of host publication | 2022 Conference on Lasers and Electro-Optics, CLEO 2022 - Proceedings |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (Electronic) | 9781957171050 |
| DOIs | |
| State | Published - 2022 |
| Event | 2022 Conference on Lasers and Electro-Optics, CLEO 2022 - San Jose, United States Duration: May 15 2022 → May 20 2022 |
Publication series
| Name | 2022 Conference on Lasers and Electro-Optics, CLEO 2022 - Proceedings |
|---|
Conference
| Conference | 2022 Conference on Lasers and Electro-Optics, CLEO 2022 |
|---|---|
| Country/Territory | United States |
| City | San Jose |
| Period | 05/15/22 → 05/20/22 |
Funding
We thank K.J.H. Law for introducing us to the pCN proposal for uniform priors. This work was performed at Oak Ridge National Laboratory, operated by UT-Battelle for the U.S. Department of Energy under contract no. DE-AC05-00OR22725. Funding was provided by the U.S. Department of Energy, Office of Science, Office of Advanced Scientific Computing Research, through the Quantum Algorithm Teams Program.
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