A Bayesian approach to nanoparticle characterization

Joseph M. Lukens, Ali Passian

Research output: Contribution to journalConference articlepeer-review

Abstract

We introduce and numerically validate a Bayesian method for plasmonic nanometrology. Applicable to any system described by a scattering cross section, our approach quantifies uncertainty automatically and enables model comparison through Bayes factors.

Original languageEnglish
Article numberFTh2B.6
JournalOptics InfoBase Conference Papers
StatePublished - 2022
EventCLEO: QELS_Fundamental Science, QELS 2022 - San Jose, United States
Duration: May 15 2022May 20 2022

Funding

This manuscript has been co-authored by UT-Battelle, LLC, under contract DE-AC05-00OR22725 with the US Department of Energy (DOE). The US government retains and the publisher, by accepting the article for publication, acknowledges that the US government retains a nonexclusive, paid-up, irrevocable, worldwide license to publish or reproduce the published form of this manuscript, or allow others to do so, for US government purposes. DOE will provide public access to these results of federally sponsored research in accordance with the DOE Public Access Plan (http://energy.gov/downloads/doe-public-access-plan). We thank K.J.H. Law for introducing us to the pCN proposal for uniform priors. This work was performed at Oak Ridge National Laboratory, operated by UT-Battelle for the U.S. Department of Energy under contract no. DE-AC05-00OR22725. Funding was provided by the U.S. Department of Energy, Office of Science, Office of Advanced Scientific Computing Research, through the Quantum Algorithm Teams Program.

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