Abstract
A gate buffer fabricated in a 2-μm 4H silicon carbide (SiC) process is presented. The circuit is composed of an input buffer stage with a push-pull output stage, and is fabricated using enhancement mode N-channel FETs in a process optimized for SiC power switching devices. Simulation and measurement results of the fabricated gate buffer are presented and compared for operation at various voltage supply levels, with a capacitive load of 2 nF. Details of the design including layout specifics, simulation results, and directions for future improvement of this buffer are presented. In addition, plans for its incorporation into an isolated high-side/low-side gate-driver architecture, fully integrated with power switching devices in a SiC process, are briefly discussed. This letter represents the first reported MOSFET-based gate buffer fabricated in 4H SiC.
| Original language | English |
|---|---|
| Article number | 6555951 |
| Pages (from-to) | 539-542 |
| Number of pages | 4 |
| Journal | IEEE Transactions on Power Electronics |
| Volume | 29 |
| Issue number | 2 |
| DOIs | |
| State | Published - 2014 |
Keywords
- 4H-SiC
- Gate buffer
- gate driver
- high-temperature electronics
- silicon carbide (SiC)
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