A 2D imager for X-ray FELs with a 65 nm CMOS readout based on per-pixel signal compression and 10 bit A/D conversion

L. Ratti; D. Comotti; L. Fabris; M. Grassi; L. Lodola; P. Malcovati; M. Manghisoni; V. Re; G. Traversi; C. Vacchi; G. Rizzo; G. Batignani; S. Bettarini; G. Casarosa; F. Forti; M. Giorgi; F. Morsani; A. Paladino; E. Paoloni; L. Pancheri; G. F. Dalla Betta; R. Mendicino; G. Verzellesi; H. Xu; M. A. Benkechkache

doi:10.1016/j.nima.2016.05.055

A 2D imager for X-ray FELs with a 65 nm CMOS readout based on per-pixel signal compression and 10 bit A/D conversion

L. Ratti
, D. Comotti
, L. Fabris
, M. Grassi
, L. Lodola
, P. Malcovati
, M. Manghisoni
, V. Re
, G. Traversi
, C. Vacchi
, G. Rizzo
, G. Batignani
, S. Bettarini
, G. Casarosa
, F. Forti
, M. Giorgi
, F. Morsani
, A. Paladino
, E. Paoloni
, L. Pancheri

G. F. Dalla Betta, R. Mendicino, G. Verzellesi, H. Xu, M. A. Benkechkache

Process Coordination

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

A readout channel for applications to X-ray diffraction imaging at free electron lasers has been developed in a 65 nm CMOS technology. The analog front-end circuit can achieve an input dynamic range of 100 dB by leveraging a novel signal compression technique based on the non-linear features of MOS capacitors. Trapezoidal shaping is accomplished through a transconductor and a switched capacitor circuit, performing gated integration and correlated double sampling. A small area, low power 10 bit successive approximation register (SAR) ADC, operated in a time-interleaved fashion, is used for numerical conversion of the amplitude measurement. Operation at 5 MHz of the analog channel including the shaper was demonstrated. Also, the channel was found to be compliant with single 1 keV photon resolution at 1.25 MHz. The ADC provides a signal-to-noise ratio (SNR) of 56 dB, corresponding to an equivalent number of bits (ENOB) of 9 bits, and a differential non linearity DNL<1 LSB at a sampling rate slightly larger than 1.8 MHz.

Original language	English
Pages (from-to)	301-308
Number of pages	8
Journal	Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume	831
DOIs	https://doi.org/10.1016/j.nima.2016.05.055
State	Published - Sep 21 2016

Funding

The research activity presented in this paper has been carried out in the framework of the PixFEL experiment funded by Istituto Nazionale di Fisica Nucleare (INFN).

Keywords

CMOS technologies
Low noise amplifiers
Low power ADC
Non-linear circuits
X-ray imaging

Access to Document

10.1016/j.nima.2016.05.055

Cite this

Ratti, L., Comotti, D., Fabris, L., Grassi, M., Lodola, L., Malcovati, P., Manghisoni, M., Re, V., Traversi, G., Vacchi, C., Rizzo, G., Batignani, G., Bettarini, S., Casarosa, G., Forti, F., Giorgi, M., Morsani, F., Paladino, A., Paoloni, E., ... Benkechkache, M. A. (2016). A 2D imager for X-ray FELs with a 65 nm CMOS readout based on per-pixel signal compression and 10 bit A/D conversion. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 831, 301-308. https://doi.org/10.1016/j.nima.2016.05.055

@article{b0960c03966f472094131ef52c86b3dc,

title = "A 2D imager for X-ray FELs with a 65 nm CMOS readout based on per-pixel signal compression and 10 bit A/D conversion",

abstract = "A readout channel for applications to X-ray diffraction imaging at free electron lasers has been developed in a 65 nm CMOS technology. The analog front-end circuit can achieve an input dynamic range of 100 dB by leveraging a novel signal compression technique based on the non-linear features of MOS capacitors. Trapezoidal shaping is accomplished through a transconductor and a switched capacitor circuit, performing gated integration and correlated double sampling. A small area, low power 10 bit successive approximation register (SAR) ADC, operated in a time-interleaved fashion, is used for numerical conversion of the amplitude measurement. Operation at 5 MHz of the analog channel including the shaper was demonstrated. Also, the channel was found to be compliant with single 1 keV photon resolution at 1.25 MHz. The ADC provides a signal-to-noise ratio (SNR) of 56 dB, corresponding to an equivalent number of bits (ENOB) of 9 bits, and a differential non linearity DNL<1 LSB at a sampling rate slightly larger than 1.8 MHz.",

keywords = "CMOS technologies, Low noise amplifiers, Low power ADC, Non-linear circuits, X-ray imaging",

author = "L. Ratti and D. Comotti and L. Fabris and M. Grassi and L. Lodola and P. Malcovati and M. Manghisoni and V. Re and G. Traversi and C. Vacchi and G. Rizzo and G. Batignani and S. Bettarini and G. Casarosa and F. Forti and M. Giorgi and F. Morsani and A. Paladino and E. Paoloni and L. Pancheri and \{Dalla Betta\}, \{G. F.\} and R. Mendicino and G. Verzellesi and H. Xu and Benkechkache, \{M. A.\}",

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Ratti, L, Comotti, D, Fabris, L, Grassi, M, Lodola, L, Malcovati, P, Manghisoni, M, Re, V, Traversi, G, Vacchi, C, Rizzo, G, Batignani, G, Bettarini, S, Casarosa, G, Forti, F, Giorgi, M, Morsani, F, Paladino, A, Paoloni, E, Pancheri, L, Dalla Betta, GF, Mendicino, R, Verzellesi, G, Xu, H & Benkechkache, MA 2016, 'A 2D imager for X-ray FELs with a 65 nm CMOS readout based on per-pixel signal compression and 10 bit A/D conversion', Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 831, pp. 301-308. https://doi.org/10.1016/j.nima.2016.05.055

A 2D imager for X-ray FELs with a 65 nm CMOS readout based on per-pixel signal compression and 10 bit A/D conversion. / Ratti, L.; Comotti, D.; Fabris, L. et al.
In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 831, 21.09.2016, p. 301-308.

Research output: Contribution to journal › Article › peer-review

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T1 - A 2D imager for X-ray FELs with a 65 nm CMOS readout based on per-pixel signal compression and 10 bit A/D conversion

AU - Ratti, L.

AU - Comotti, D.

AU - Fabris, L.

AU - Grassi, M.

AU - Lodola, L.

AU - Malcovati, P.

AU - Manghisoni, M.

AU - Re, V.

AU - Traversi, G.

AU - Vacchi, C.

AU - Rizzo, G.

AU - Batignani, G.

AU - Bettarini, S.

AU - Casarosa, G.

AU - Forti, F.

AU - Giorgi, M.

AU - Morsani, F.

AU - Paladino, A.

AU - Paoloni, E.

AU - Pancheri, L.

AU - Dalla Betta, G. F.

AU - Mendicino, R.

AU - Verzellesi, G.

AU - Xu, H.

AU - Benkechkache, M. A.

PY - 2016/9/21

Y1 - 2016/9/21

N2 - A readout channel for applications to X-ray diffraction imaging at free electron lasers has been developed in a 65 nm CMOS technology. The analog front-end circuit can achieve an input dynamic range of 100 dB by leveraging a novel signal compression technique based on the non-linear features of MOS capacitors. Trapezoidal shaping is accomplished through a transconductor and a switched capacitor circuit, performing gated integration and correlated double sampling. A small area, low power 10 bit successive approximation register (SAR) ADC, operated in a time-interleaved fashion, is used for numerical conversion of the amplitude measurement. Operation at 5 MHz of the analog channel including the shaper was demonstrated. Also, the channel was found to be compliant with single 1 keV photon resolution at 1.25 MHz. The ADC provides a signal-to-noise ratio (SNR) of 56 dB, corresponding to an equivalent number of bits (ENOB) of 9 bits, and a differential non linearity DNL<1 LSB at a sampling rate slightly larger than 1.8 MHz.

AB - A readout channel for applications to X-ray diffraction imaging at free electron lasers has been developed in a 65 nm CMOS technology. The analog front-end circuit can achieve an input dynamic range of 100 dB by leveraging a novel signal compression technique based on the non-linear features of MOS capacitors. Trapezoidal shaping is accomplished through a transconductor and a switched capacitor circuit, performing gated integration and correlated double sampling. A small area, low power 10 bit successive approximation register (SAR) ADC, operated in a time-interleaved fashion, is used for numerical conversion of the amplitude measurement. Operation at 5 MHz of the analog channel including the shaper was demonstrated. Also, the channel was found to be compliant with single 1 keV photon resolution at 1.25 MHz. The ADC provides a signal-to-noise ratio (SNR) of 56 dB, corresponding to an equivalent number of bits (ENOB) of 9 bits, and a differential non linearity DNL<1 LSB at a sampling rate slightly larger than 1.8 MHz.

KW - CMOS technologies

KW - Low noise amplifiers

KW - Low power ADC

KW - Non-linear circuits

KW - X-ray imaging

UR - https://www.scopus.com/pages/publications/84971632021

U2 - 10.1016/j.nima.2016.05.055

DO - 10.1016/j.nima.2016.05.055

M3 - Article

AN - SCOPUS:84971632021

SN - 0168-9002

VL - 831

SP - 301

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JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

ER -

Ratti L, Comotti D, Fabris L, Grassi M, Lodola L, Malcovati P et al. A 2D imager for X-ray FELs with a 65 nm CMOS readout based on per-pixel signal compression and 10 bit A/D conversion. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2016 Sep 21;831:301-308. doi: 10.1016/j.nima.2016.05.055