TY - JOUR
T1 - A 2D imager for X-ray FELs with a 65 nm CMOS readout based on per-pixel signal compression and 10 bit A/D conversion
AU - Ratti, L.
AU - Comotti, D.
AU - Fabris, L.
AU - Grassi, M.
AU - Lodola, L.
AU - Malcovati, P.
AU - Manghisoni, M.
AU - Re, V.
AU - Traversi, G.
AU - Vacchi, C.
AU - Rizzo, G.
AU - Batignani, G.
AU - Bettarini, S.
AU - Casarosa, G.
AU - Forti, F.
AU - Giorgi, M.
AU - Morsani, F.
AU - Paladino, A.
AU - Paoloni, E.
AU - Pancheri, L.
AU - Dalla Betta, G. F.
AU - Mendicino, R.
AU - Verzellesi, G.
AU - Xu, H.
AU - Benkechkache, M. A.
N1 - Publisher Copyright:
© 2016 Elsevier B.V.
PY - 2016/9/21
Y1 - 2016/9/21
N2 - A readout channel for applications to X-ray diffraction imaging at free electron lasers has been developed in a 65 nm CMOS technology. The analog front-end circuit can achieve an input dynamic range of 100 dB by leveraging a novel signal compression technique based on the non-linear features of MOS capacitors. Trapezoidal shaping is accomplished through a transconductor and a switched capacitor circuit, performing gated integration and correlated double sampling. A small area, low power 10 bit successive approximation register (SAR) ADC, operated in a time-interleaved fashion, is used for numerical conversion of the amplitude measurement. Operation at 5 MHz of the analog channel including the shaper was demonstrated. Also, the channel was found to be compliant with single 1 keV photon resolution at 1.25 MHz. The ADC provides a signal-to-noise ratio (SNR) of 56 dB, corresponding to an equivalent number of bits (ENOB) of 9 bits, and a differential non linearity DNL<1 LSB at a sampling rate slightly larger than 1.8 MHz.
AB - A readout channel for applications to X-ray diffraction imaging at free electron lasers has been developed in a 65 nm CMOS technology. The analog front-end circuit can achieve an input dynamic range of 100 dB by leveraging a novel signal compression technique based on the non-linear features of MOS capacitors. Trapezoidal shaping is accomplished through a transconductor and a switched capacitor circuit, performing gated integration and correlated double sampling. A small area, low power 10 bit successive approximation register (SAR) ADC, operated in a time-interleaved fashion, is used for numerical conversion of the amplitude measurement. Operation at 5 MHz of the analog channel including the shaper was demonstrated. Also, the channel was found to be compliant with single 1 keV photon resolution at 1.25 MHz. The ADC provides a signal-to-noise ratio (SNR) of 56 dB, corresponding to an equivalent number of bits (ENOB) of 9 bits, and a differential non linearity DNL<1 LSB at a sampling rate slightly larger than 1.8 MHz.
KW - CMOS technologies
KW - Low noise amplifiers
KW - Low power ADC
KW - Non-linear circuits
KW - X-ray imaging
UR - http://www.scopus.com/inward/record.url?scp=84971632021&partnerID=8YFLogxK
U2 - 10.1016/j.nima.2016.05.055
DO - 10.1016/j.nima.2016.05.055
M3 - Article
AN - SCOPUS:84971632021
SN - 0168-9002
VL - 831
SP - 301
EP - 308
JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
ER -