7.4: Dose control circuits for digitally addressable VACNF based maskless lithography

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Abstract

This paper presents dose control electronics and a digital addressing method for the vertically aligned carbon nanofiber (VACNF) based massively parallel maskless e-beam lithography system. The Digital Electrostatically focused e-beam Array direct-write Lithography (DEAL) developed by our research group in Oak Ridge National Laboratory [1] incorporates digitally addressable field emission arrays (DAFEAs) of the VACNFs which function as the lithography heads during the exposure of the resist. A logic and memory control circuit (LMC) and a dose control circuit (DCC) have been designed to write a desired pattern and control the dose of electrons, respectively. This paper summarizes our previous works on different versions of the DCCs [2- 4] designed and optimized in the effort of obtaining a fixed and optimum dosage with the smaller circuit area.

Original languageEnglish
Title of host publication23rd International Vacuum Nanoelectronics Conference, IVNC 2010
Pages109-110
Number of pages2
DOIs
StatePublished - 2010
Event23rd International Vacuum Nanoelectronics Conference, IVNC 2010 - Palo Alto, CA, United States
Duration: Jul 26 2010Jul 30 2010

Publication series

Name23rd International Vacuum Nanoelectronics Conference, IVNC 2010

Conference

Conference23rd International Vacuum Nanoelectronics Conference, IVNC 2010
Country/TerritoryUnited States
CityPalo Alto, CA
Period07/26/1007/30/10

Keywords

  • Dose control circuit
  • Maskess lithography
  • Vertically aligned carbon nanofiber

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