3D imaging with single atom sensitivity using confocal STEM

K. Van Benthem; N. De Jonge; A. Y. Borisevich; M. P. Oxley; S. J. Pennycook

doi:10.1017/S1431927606066700

3D imaging with single atom sensitivity using confocal STEM

K. Van Benthem, N. De Jonge, A. Y. Borisevich, M. P. Oxley, S. J. Pennycook

electron Microscopy and Microanalysis

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Original language	English
Pages (from-to)	1562-1563
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	12
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927606066700
State	Published - Aug 2006

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title = "3D imaging with single atom sensitivity using confocal STEM",

author = "\{Van Benthem\}, K. and \{De Jonge\}, N. and Borisevich, \{A. Y.\} and Oxley, \{M. P.\} and Pennycook, \{S. J.\}",

year = "2006",

month = aug,

doi = "10.1017/S1431927606066700",

language = "English",

volume = "12",

pages = "1562--1563",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "SUPPL. 2",

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T1 - 3D imaging with single atom sensitivity using confocal STEM

AU - Van Benthem, K.

AU - De Jonge, N.

AU - Borisevich, A. Y.

AU - Oxley, M. P.

AU - Pennycook, S. J.

PY - 2006/8

Y1 - 2006/8

UR - https://www.scopus.com/pages/publications/33750863968

U2 - 10.1017/S1431927606066700

DO - 10.1017/S1431927606066700

M3 - Article

AN - SCOPUS:33750863968

SN - 1431-9276

VL - 12

SP - 1562

EP - 1563

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

3D imaging with single atom sensitivity using confocal STEM

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