3D imaging with single atom sensitivity using confocal STEM

K. Van Benthem; N. De Jonge; A. Y. Borisevich; M. P. Oxley; S. J. Pennycook

doi:10.1017/S1431927606066700

3D imaging with single atom sensitivity using confocal STEM

K. Van Benthem
, N. De Jonge
, A. Y. Borisevich
, M. P. Oxley
, S. J. Pennycook

electron Microscopy and Microanalysis

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Original language	English
Pages (from-to)	1562-1563
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	12
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927606066700
State	Published - Aug 2006

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10.1017/S1431927606066700

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title = "3D imaging with single atom sensitivity using confocal STEM",

author = "\{Van Benthem\}, K. and \{De Jonge\}, N. and Borisevich, \{A. Y.\} and Oxley, \{M. P.\} and Pennycook, \{S. J.\}",

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language = "English",

volume = "12",

pages = "1562--1563",

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publisher = "Oxford University Press",

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T1 - 3D imaging with single atom sensitivity using confocal STEM

AU - Van Benthem, K.

AU - De Jonge, N.

AU - Borisevich, A. Y.

AU - Oxley, M. P.

AU - Pennycook, S. J.

PY - 2006/8

Y1 - 2006/8

UR - https://www.scopus.com/pages/publications/33750863968

U2 - 10.1017/S1431927606066700

DO - 10.1017/S1431927606066700

M3 - Article

AN - SCOPUS:33750863968

SN - 1431-9276

VL - 12

SP - 1562

EP - 1563

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

3D imaging with single atom sensitivity using confocal STEM

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