3D imaging with single atom sensitivity using confocal STEM

K. Van Benthem, N. De Jonge, A. Y. Borisevich, M. P. Oxley, S. J. Pennycook

Research output: Contribution to journalArticlepeer-review

1 Scopus citations
Original languageEnglish
Pages (from-to)1562-1563
Number of pages2
JournalMicroscopy and Microanalysis
Volume12
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 2006

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