Original language | English |
---|---|
Pages (from-to) | 1562-1563 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 12 |
Issue number | SUPPL. 2 |
DOIs | |
State | Published - Aug 2006 |
3D imaging with single atom sensitivity using confocal STEM
K. Van Benthem, N. De Jonge, A. Y. Borisevich, M. P. Oxley, S. J. Pennycook
Research output: Contribution to journal › Article › peer-review
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