Abstract
Show me inside: 3D time-of-flight secondary-ion mass spectrometry (TOF-SIMS) with a dual-beam mode allows the detection of the characteristic biopolymers from surface to subsurface in plant cell walls. Lateral and vertical distribution of major components can thereby be mapped to understand the structural architecture of plant cell walls at under sub-micrometer scales (see picture: green=cellulose, red=lignin).
Original language | English |
---|---|
Pages (from-to) | 12005-12008 |
Number of pages | 4 |
Journal | Angewandte Chemie - International Edition |
Volume | 51 |
Issue number | 48 |
DOIs | |
State | Published - Nov 26 2012 |
Keywords
- 3D TOF-SIMS
- biomass
- imaging mass spectrometry
- wood