Abstract
In the present paper, by means of scanning tunneling microscopy, low-energy electron diffraction, and Auger electron spectroscopy, we have found and studied the {310} faceting induced by In on the Ge(001)2 × 1 surface. On the basis of the dual bias STM images a model, which contains one In atom and only one dangling bond in a unit cell, has been proposed for the atomic structure of the {310} facets. We suppose that the faceting process proceeds through expansion of many mini-{310}-facets in the cost of the original (001) surface, instead of via any other transient surface structures.
Original language | English |
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Pages (from-to) | L851-L856 |
Journal | Surface Science |
Volume | 338 |
Issue number | 1-3 |
DOIs | |
State | Published - Sep 10 1995 |
Externally published | Yes |
Funding
This work was supported by the National Natural Science Foundation of China and the Doctoral Program Foundation of the Education Ministry of China.
Keywords
- Germanium
- Indium
- Low energy electron diffraction (LEED)
- Scanning tunneling microscopy
- Surface relaxation and reconstruction