{310} faceting of the Ge(001) 2 × 1 surface induced by indium

Zheng Gai, Hang Ji, Yi He, Chuan Hu, R. G. Zhao, W. S. Yang

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30 Scopus citations

Abstract

In the present paper, by means of scanning tunneling microscopy, low-energy electron diffraction, and Auger electron spectroscopy, we have found and studied the {310} faceting induced by In on the Ge(001)2 × 1 surface. On the basis of the dual bias STM images a model, which contains one In atom and only one dangling bond in a unit cell, has been proposed for the atomic structure of the {310} facets. We suppose that the faceting process proceeds through expansion of many mini-{310}-facets in the cost of the original (001) surface, instead of via any other transient surface structures.

Original languageEnglish
Pages (from-to)L851-L856
JournalSurface Science
Volume338
Issue number1-3
DOIs
StatePublished - Sep 10 1995
Externally publishedYes

Funding

This work was supported by the National Natural Science Foundation of China and the Doctoral Program Foundation of the Education Ministry of China.

Keywords

  • Germanium
  • Indium
  • Low energy electron diffraction (LEED)
  • Scanning tunneling microscopy
  • Surface relaxation and reconstruction

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