2D strain mapping using scanning transmission electron microscopy Moiré interferometry and geometrical phase analysis

A. Pofelski; S. Y. Woo; B. H. Le; X. Liu; S. Zhao; Z. Mi; S. Löffler; G. A. Botton

doi:10.1016/j.ultramic.2017.12.016

2D strain mapping using scanning transmission electron microscopy Moiré interferometry and geometrical phase analysis

A. Pofelski, S. Y. Woo, B. H. Le, X. Liu, S. Zhao, Z. Mi, S. Löffler, G. A. Botton

Research output: Contribution to journal › Article › peer-review

32 Scopus citations

Abstract

A strain characterization technique based on Moiré interferometry in a scanning transmission electron microscope (STEM) and geometrical phase analysis (GPA) method is demonstrated. The deformation field is first captured in a single STEM Moiré hologram composed of multiple sets of periodic fringes (Moiré patterns) generated from the interference between the periodic scanning grating, fixing the positions of the electron probe on the sample, and the crystal structure. Applying basic principles from sampling theory, the Moiré patterns arrangement is then simulated using a STEM electron micrograph reference to convert the experimental STEM Moiré hologram into information related to the crystal lattice periodicities. The GPA method is finally applied to extract the 2D relative strain and rotation fields. The STEM Moiré interferometry enables the local information to be de-magnified to a large length scale, comparable to what can be achieved in dark-field electron holography. The STEM Moiré GPA method thus extends the conventional high-resolution STEM GPA capabilities by providing comparable quantitative 2D strain mapping with a larger field of view (up to a few microns).

Original language	English
Pages (from-to)	1-12
Number of pages	12
Journal	Ultramicroscopy
Volume	187
DOIs	https://doi.org/10.1016/j.ultramic.2017.12.016
State	Published - Apr 2018
Externally published	Yes

Funding

S. Löffler acknowledges financial support by the Austrian Science Fund (FWF) under grant number J3732-N27 . G. A. Botton is grateful to NSERC for a Discovery Grant supporting this work. The experimental work was carried out at the Canadian Centre for Electron Microscopy, a national facility supported by the Canada Foundation for Innovation under the Major Science Initiative program, NSERC and McMaster University. The authors acknowledge I. Bicket and J. Cooper for proof reading the document.

Funders	Funder number
McMaster University
Natural Sciences and Engineering Research Council of Canada
Canada Foundation for Innovation
Austrian Science Fund	J3732-N27
Austrian Science Fund

Keywords

Geometrical phase analysis
Holography
Moiré interferometry
Scanning transmission electron microscopy
Strain characterization

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10.1016/j.ultramic.2017.12.016

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title = "2D strain mapping using scanning transmission electron microscopy Moir{\'e} interferometry and geometrical phase analysis",

abstract = "A strain characterization technique based on Moir{\'e} interferometry in a scanning transmission electron microscope (STEM) and geometrical phase analysis (GPA) method is demonstrated. The deformation field is first captured in a single STEM Moir{\'e} hologram composed of multiple sets of periodic fringes (Moir{\'e} patterns) generated from the interference between the periodic scanning grating, fixing the positions of the electron probe on the sample, and the crystal structure. Applying basic principles from sampling theory, the Moir{\'e} patterns arrangement is then simulated using a STEM electron micrograph reference to convert the experimental STEM Moir{\'e} hologram into information related to the crystal lattice periodicities. The GPA method is finally applied to extract the 2D relative strain and rotation fields. The STEM Moir{\'e} interferometry enables the local information to be de-magnified to a large length scale, comparable to what can be achieved in dark-field electron holography. The STEM Moir{\'e} GPA method thus extends the conventional high-resolution STEM GPA capabilities by providing comparable quantitative 2D strain mapping with a larger field of view (up to a few microns).",

keywords = "Geometrical phase analysis, Holography, Moir{\'e} interferometry, Scanning transmission electron microscopy, Strain characterization",

author = "A. Pofelski and Woo, {S. Y.} and Le, {B. H.} and X. Liu and S. Zhao and Z. Mi and S. L{\"o}ffler and Botton, {G. A.}",

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year = "2018",

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AU - Pofelski, A.

AU - Woo, S. Y.

AU - Le, B. H.

AU - Liu, X.

AU - Zhao, S.

AU - Mi, Z.

AU - Löffler, S.

AU - Botton, G. A.

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N2 - A strain characterization technique based on Moiré interferometry in a scanning transmission electron microscope (STEM) and geometrical phase analysis (GPA) method is demonstrated. The deformation field is first captured in a single STEM Moiré hologram composed of multiple sets of periodic fringes (Moiré patterns) generated from the interference between the periodic scanning grating, fixing the positions of the electron probe on the sample, and the crystal structure. Applying basic principles from sampling theory, the Moiré patterns arrangement is then simulated using a STEM electron micrograph reference to convert the experimental STEM Moiré hologram into information related to the crystal lattice periodicities. The GPA method is finally applied to extract the 2D relative strain and rotation fields. The STEM Moiré interferometry enables the local information to be de-magnified to a large length scale, comparable to what can be achieved in dark-field electron holography. The STEM Moiré GPA method thus extends the conventional high-resolution STEM GPA capabilities by providing comparable quantitative 2D strain mapping with a larger field of view (up to a few microns).

AB - A strain characterization technique based on Moiré interferometry in a scanning transmission electron microscope (STEM) and geometrical phase analysis (GPA) method is demonstrated. The deformation field is first captured in a single STEM Moiré hologram composed of multiple sets of periodic fringes (Moiré patterns) generated from the interference between the periodic scanning grating, fixing the positions of the electron probe on the sample, and the crystal structure. Applying basic principles from sampling theory, the Moiré patterns arrangement is then simulated using a STEM electron micrograph reference to convert the experimental STEM Moiré hologram into information related to the crystal lattice periodicities. The GPA method is finally applied to extract the 2D relative strain and rotation fields. The STEM Moiré interferometry enables the local information to be de-magnified to a large length scale, comparable to what can be achieved in dark-field electron holography. The STEM Moiré GPA method thus extends the conventional high-resolution STEM GPA capabilities by providing comparable quantitative 2D strain mapping with a larger field of view (up to a few microns).

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2D strain mapping using scanning transmission electron microscopy Moiré interferometry and geometrical phase analysis

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Keywords

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