2D soft x-ray system on DIII-D for imaging the magnetic topology in the pedestal region

M. W. Shafer, D. J. Battaglia, E. A. Unterberg, T. E. Evans, D. L. Hillis, R. Maingi

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

A new tangential two-dimensional soft x-ray imaging system (SXRIS) is being designed to examine the edge island structure in the lower X-point region of DIII-D. Plasma shielding and/or amplification of the calculated vacuum islands may play a role in the suppression of edge-localized modes via resonant magnetic perturbations (RMPs). The SXRIS is intended to improve the understanding of three-dimensional (3D) phenomena associated with RMPs. This system utilizes a tangential view with a pinhole imaging system and spectral filtering with beryllium foils. SXR emission is chosen to avoid line radiation and allows suitable signal at the top of a H-mode pedestal where Te ∼1-2 keV. A synthetic diagnostic calculation based on 3D SXR emissivity estimates is used to help assess signal levels and resolution of the design. A signal-to-noise ratio of 10 at 1 cm resolution is expected for the perturbed signals, which are sufficient to resolve most of the predicted vacuum island sizes.

Original languageEnglish
Article number10E534
JournalReview of Scientific Instruments
Volume81
Issue number10
DOIs
StatePublished - Oct 2010

Funding

This work was supported in part by the U.S. Department of Energy under Grant Nos. DE-AC05-00OR22725 and DE-FC02-04ER54698.

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