@inproceedings{09cab00053074094a106be61218040c3,
title = "1/f Noise and DC characterization of partially depleted SOI N- and P-MOSFETs from 20°C-250°C",
abstract = "A summary of measured small-signal parameters and low frequency noise characterized over temperature is presented for N- and P- MOSFETs fabricated in a partially depleted SOI 0.8-μm process. Small-signal dc parameters critical in analog circuit design are reported including device transconductance efficiency (g m/I d), output resistance (r ds, and threshold voltage (V t). These parameters are summarized as a function of both gate length (0.8μm, 2.0μm, 5.0μm, and 20μm) and temperature (20°to 300°C). Noise characterization of these devices is also presented with an emphasis on flicker noise over temperature (20°to 250°C). Data is presented in terms of both drain current and inversion coefficient, where appropriate. Use of this information provides the designer with an excellent tool for estimating analog circuit performance in applications where wide temperature range performance is required.",
author = "Ericson, {M. N.} and M. Hasanuzzaman and Terry, {S. C.} and Britton, {C. L.} and B. Ohme and Frank, {S. S.} and Richmond, {J. A.} and Blalock, {B. J.}",
year = "2005",
doi = "10.1109/AERO.2005.1559566",
language = "English",
isbn = "0780388704",
series = "IEEE Aerospace Conference Proceedings",
booktitle = "Proceedings - 2005 IEEE Aerospace Conference",
note = "2005 IEEE Aerospace Conference ; Conference date: 05-03-2005 Through 12-03-2005",
}