Material Science
Activation Energy
22%
Aluminum Nitride
10%
Annealing
8%
Buffer Layer
11%
Cathode
15%
Cerium Oxide
11%
Chemical Vapor Deposition
10%
Composite Material
11%
Conductor
10%
Crystal Structure
16%
Crystallite Size
9%
Density
13%
Dielectric Material
14%
Diffraction Measurement
17%
Doping (Additives)
9%
Electrical Conductivity
9%
Epitaxy
11%
Film
64%
Heat Treatment
9%
High Energy Density
9%
Lanthanum
12%
Lattice Constant
24%
Lithium
13%
Lithium Ion Battery
18%
Manganese
8%
Mechanical Property
12%
Nanocrystalline
20%
Nanoparticle
11%
Neutron Diffraction
47%
Nitride Compound
9%
Nucleation
25%
Oxidation Reaction
13%
Oxide Compound
36%
Phase Composition
35%
Pulsed Laser Deposition
8%
Residual Stress
47%
Scanning Electron Microscopy
13%
Silicon Dioxide
9%
Single Crystal
20%
Sol-Gel
14%
Solid Solutions
17%
Surface (Surface Science)
20%
Thermal Expansion
30%
Thin Films
35%
Transition Metal
13%
Transmission Electron Microscopy
11%
Vanadium
17%
X-Ray Diffraction
100%
Yttria Stabilized Zirconia
10%
Zirconia
20%
Engineering
Activation Energy
17%
Additive Manufacturing
9%
Alloy Phase
5%
Aromatics
6%
Barrier Layer
7%
Buffer Layer
7%
Chemical Vapor Deposition
10%
Coefficient of Thermal Expansion
15%
Creep
5%
Crystal Structure
5%
Dopants
5%
Elevated Temperature
7%
Epitaxial Film
6%
Experimental Determination
10%
Glass Substrate
7%
Growth Temperature
6%
Heat Treatment
11%
Hydrogen Storage
7%
Isothermal
26%
Lattice Constant
13%
Lattice Parameter
12%
Lithium-Ion Batteries
5%
Low-Temperature
13%
Mechanical Property
5%
Mols
22%
Nanomaterial
7%
Nanoscale
6%
Phase Composition
22%
Phase Stability
6%
Polycrystalline
5%
Pulsed Laser
10%
Ray Diffraction
53%
Reaction Model
6%
Residual Strain
5%
Residual Stress
58%
Residual Stress Distribution
5%
Room Temperature
20%
Silicon Dioxide
7%
Sintering
8%
Situ Investigation
5%
Solid Solutions
11%
Spent Nuclear Fuel
5%
Stress State
6%
Temperature Range
24%
Thin Films
20%
Vapor Deposition
9%
Welds
18%
X-Ray Powder Diffraction
7%
Young's Modulus
5%
Yttria-Stabilized Zirconia
11%
